px4dev de078b4525 Move the bson sample data out of the BSS, saves 256 bytes of RAM

2013-03-10 14:59:38 -07:00

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.context

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Makefile

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test_adc.c

Fixed test outputs, decoupled tests from NuttX low-level output via message() macro

2013-02-01 13:02:20 +01:00

test_bson.c

Move the bson sample data out of the BSS, saves 256 bytes of RAM

2013-03-10 14:59:38 -07:00

test_float.c

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test_gpio.c

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test_hott_telemetry.c

We aren't using RS485 but single wire.

2013-01-21 23:31:12 +01:00

test_hrt.c

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test_int.c

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test_jig_voltages.c

Adapted upper and lower values for test jig voltages

2013-01-14 09:18:17 -08:00

test_led.c

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test_sensors.c

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test_servo.c

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test_sleep.c

Cleaned up tests further, in anticipation of merges with other branches

2013-01-12 23:26:26 +01:00

test_time.c

Fix the 'time' test, now that rand() seems to be working.

2013-01-14 10:08:47 -08:00

test_uart_baudchange.c

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test_uart_console.c

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test_uart_loopback.c

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test_uart_send.c

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tests_file.c

Fixed #153 - when no microSD card is present, test used to hang, now aborts with error.

2013-01-13 09:35:56 +01:00

tests_main.c

Fixed test outputs, decoupled tests from NuttX low-level output via message() macro

2013-02-01 13:02:20 +01:00

tests_param.c

Remove a few cut-and-paste author attributions.

2012-12-02 17:53:31 -08:00

tests.h

Assorted compile fixes.

2013-02-06 23:50:55 -08:00